Characterization of WSe2 Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses

ACS NANO

ZHANG, T.; HOLZER, J.; VYSTAVĚL, T.; KOLÍBAL, M.; PAIVA DE ARAÚJO, E.; STEPHENS, C.; BEN BRITTON, T., 2025: Characterization of WSe2 Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses. ACS NANO 19(44), p. 38360 - 38370, doi: 10.1021/acsnano.5c10753; FULL TEXT
(MPS150, NANOSCAN, WITEC-RAMAN)

Equipment:

• 4-probe station Cascade Microtech MPS 150 (MPS150)
• NanoScan VLS-80 (NANOSCAN)
• Witec Alpha 300R (WITEC-RAMAN)

Research Groups:

• Fabrication and Characterisation of Nanostructures
• CF: CEITEC Nano

CEITEC authors:

• Prof. Miroslav Kolíbal, Ph.D.
• Estácio Paiva de Araújo, Ph.D.