Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity

ACS APPL MATER INTER

KONEČNÝ, M.; BARTOŠÍK, M.; MACH, J.; ŠVARC, V.; NEZVAL, D.; PIASTEK, J.; PROCHÁZKA, P.; CAHLÍK, A.; ŠIKOLA, T., 2018: Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity. ACS APPL MATER INTER 10(14), p. 11987 - 8, doi: 10.1021/acsami.7b18041; FULL TEXT
(TERS)

Equipment:

• Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II (TERS)

Research Groups:

• CF: CEITEC Nano
• Fabrication and Characterisation of Nanostructures
• Development of Methods for Analysis and Measuring

CEITEC authors:

• Martin Konečný
• Miroslav Bartošík, Ph.D.
• Jindřich Mach, Ph.D.
• Vojtěch Švarc, Ph.D.
• David Nezval, Ph.D.
• Jakub Piastek, Ph.D.
• Pavel Procházka, Ph.D.
• Prof. Tomáš Šikola