Materials That Do Not Form Any Defects After WEDM

Mouralova, K.; Fries, J.; Benes, L.; Houska, P., 2024: . PROCESSES 12(11), doi: 10.3390/pr12112448; FULL TEXT
(DEKTAK, LYRA, TEGRAMIN)

Equipment:

• Mechanical profilometer Bruker Dektak XT (DEKTAK)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
• Grinder/polisher Tegramin 30 (TEGRAMIN)

Research Groups:

• CF: CEITEC Nano