Analysis of cut orientation through half-finished product using WEDM

Mouralova, K.; Benes, L.; Zahradnicek, R.; Bednar, J.; Hrabec, P.; Prokes, T., Hrdy, R., 2019: . MATERIALS AND MANUFACTURING PROCESSES 34(1), p. 70 - 82, doi: 10.1080/10426914.2018.1544714
(HELIOS, TITAN, TEGRAMIN, LYRA)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed (TITAN)
• Grinder/polisher Tegramin 30 (TEGRAMIN)
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Radim Zahradníček, Ph.D.