Ellipsometry, reflectance, and photoluminescence of nanocrystalline CuCl thin films on silicon

Journal of Vacuum Science & Technology B

Humlíček, J.; Kuldová, K.; Krumpolec, R.; Cameron, D. C., 2019: Ellipsometry, reflectance, and photoluminescence of nanocrystalline CuCl thin films on silicon. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 37(5), p. 051206-1 - 051206-5, doi: 10.1116/1.5121240
(RIGAKU9)

Equipment:

• X-ray diffractometer with high brightness source Rigaku SmartLab 9kW (RIGAKU9)

Research Groups:

• CF: CEITEC Nano