Oxygen-pressure-tuned phase stability, microstructure, and magnetic properties of BiFeO₃ films on titanium-buffered silicon

Surfaces and Interfaces

Fawaeer, S. H.; Horník, V.; Al-Qaisi, W. M.; Sedláková, V.; Mousa, M. S.; Knápek, A.; Sobola, D., 2026: Oxygen-pressure-tuned phase stability, microstructure, and magnetic properties of BiFeO₃ films on titanium-buffered silicon. SURFACES AND INTERFACES 86, doi: 10.1016/j.surfin.2026.108769; FULL TEXT
(KRATOS-XPS, RIGAKU3, HELIOS, VERIOS, WOOLLAM-VIS, VERSALAB, ICON-SPM, MAGNETRON)

Equipment:

• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)
• X-ray powder diffractometer Rigaku SmartLab 3kW (RIGAKU3)
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• High resolution Scanning Electron Microscope FEI Verios 460L (VERIOS)
• NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)
• Cryogenic-free VSM and ETO measurement system – Quantum Design, VersaLab (VERSALAB)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)
• Magnetron sputtering system BESTEC (MAGNETRON)

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Prof. Dinara Sobola, Ph.D.