J.A. Woollam RC2 Mapping Spectroscopic Ellipsometer (WOOLLAM-RC2)
Instrument status:
Operational
Equipment placement:
CEITEC Nano - C1.21
Variable-angle spectroscopic ellipsometer with two rotating compensators enabling measurement of 16 components of the Mueller matrix. Thanks to array detectors, measurements are performed simultaneously very accurately and very quickly for all fixed spectral points. During the measurement, full light falls on the sample. Sample adjustment is automatic and very fast. The ellipsometer setup includes a very fast mapping stage.
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+420 54114 9207
nano@ceitec.vutbr.cz
