In-situ characterization of semiconductors using scanning probe microscopy techniques

Master´s Thesis

Očkovič, A., 2024: In-situ characterization of semiconductors using scanning probe microscopy techniques. MASTER´S THESIS , p. 1 - 74; FULL TEXT
(LITESCOPE-MIRA-STAN, MIRA-STAN)

Equipment:

• LiteScope 2.5 (LITESCOPE-MIRA-STAN)
• Scanning electron microscope (SEM) MIRA3 XMU (MIRA-STAN)

Research Groups:

• Fabrication and Characterisation of Nanostructures
• CF: CEITEC Nano

CEITEC authors:

• Adam Očkovič