CEITEC Nano Research Infrastructure
Brno University of Technology
Purkyňova 123, 612 00 Brno
Czech Republic
+420 54114 9207
nano@ceitec.vutbr.cz
Consumables | wh | ShP | i | feedback
FOUR-POINT PROBE (4-POINT)
Guarantor:
Viktor Danchuk
Instrument status:
Operational, 4.3.2025 16:28
Equipment placement:
CEITEC Nano - C1.57
The Ossila Four-Point Probe is an easy-to-use tool for the rapid measurement of sheet resistance of thin films. Sheet resistance (also known as surface resistance or surface resistivity) is a common electrical property used to characterize thin films of conducting and semiconducting materials. It is a measure of the lateral resistance through a thin square of material, i.e. the resistance between opposite sides of a square. The key advantage of sheet resistance over other resistance measurements is that it is independent of the size of the square, enabling easy comparisons between different samples.
Photogallery
Specification
Electrical Specifications:
Voltage Range ±100 μV to ±10 V
Current Range ±1 μA to ±200 mA (5 ranges)
Sheet Resistance Range 100 mΩ/□ to 10 MΩ/□ (ohms per square)
| Sheet Resistance | Accuracy* | Precision** | Measured at Range |
| 100 mΩ/□ | ±8% | ±3% | 200 mA |
| 1 Ω/□ | ±2% | ±0.5% | 200 mA |
| 10 Ω/□ | ±1% | ±0.5% | 200 mA |
| 100 Ω/□ | ±1% | ±0.05% | 20 mA |
| 1 kΩ/□ | ±1% | ±0.03% | 20 mA |
| 10 kΩ/□ | ±1% | ±0.02% | 2000 µA |
| 100 kΩ/□ | ±2% | ±0.05% | 200 µA |
| 1 MΩ/□ | ±8% | ±0.5% | 20 µA |
| 10 MΩ/□ | ±30% | ±5% | 20 µA |
Physical Specifications:
| Probe Spacing | 1.27 mm (0.05") |
| Rectangular Sample Size Range | Long Edge Minimum: 5 mm (0.20") Short Edge Maximum: 152.4 mm (6") |
| Circular Sample Size Range (Diameter) | 5 mm to 152.4 mm (0.20" to 6.00") |
| Maximum Sample Thickness | 8 mm (0.31") |
| Overall Dimensions (W x H x D) | 145 mm x 150 mm x 240 mm (5.71" x 5.91" x 9.45") |
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