Fabrication and Electrical Characterization of Dot Capacitors for Cold Field Emission Applications

ACS OMEGA

Alsoud, A.; Shaheen, AA.; Knápek, A.; Al-Bashaish, SR.; Ahmad, MDJ.; Mousa, MS.; Sobola, D., 2025: Fabrication and Electrical Characterization of Dot Capacitors for Cold Field Emission Applications. ACS OMEGA , p. 11108 - 11, doi: 10.1021/acsomega.4c10081; FULL TEXT
(MIRA-STAN)

Equipment:

• Scanning electron microscope (SEM) MIRA3 XMU (MIRA-STAN)

Research Groups:

• Advanced Ceramic Materials
• CF: CEITEC Nano

CEITEC authors:

• Dinara Sobola, Ph.D.
• Ammar AL Soud