Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry

Hale, N.; Hartl, M.; Humlicek, J.; Brüne, C.; Kildemo, M., 2023: . OPTICAL MATERIALS EXPRESS 13(7), p. 2020 - 16, doi: 10.1364/OME.493426; FULL TEXT
(WOOLLAM-MIR, WOOLLAM-VIS)

Equipment:

• MIR spectroscopic ellipsometer J. A. Woollam IR-VASE (WOOLLAM-MIR)
• NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

Research Groups:

• CF: CEITEC Nano
• Fabrication and Characterisation of Nanostructures

CEITEC authors:

• Prof. Josef Humlíček