Determining the sub-surface damage of CdTe single crystals after lapping

ŠIK, O.; ŠKVARENINA, Ľ.; CAHA, O.; MORAVEC, P.; ŠKARVADA, P.; BELAS, E.; GRMELA, L., 2018: . JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 29(11), p. 9652 - 10, doi: 10.1007/s10854-018-9002-7; FULL TEXT
(RIGAKU9, HELIOS, DEKTAK)

Equipment:

• X-ray diffractometer with high brightness source Rigaku SmartLab 9kW (RIGAKU9)
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)
• Mechanical profilometer Bruker Dektak XT (DEKTAK)

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Ondřej Šik, Ph.D.
• Ondřej Caha, Ph.D.