Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS

KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L., 2019: . APPLIED SURFACE SCIENCE 493, p. 673 - 6, doi: 10.1016/j.apsusc.2019.07.058; FULL TEXT
(EVAPORATOR, WOOLLAM-VIS, ICON-SPM, KRATOS-XPS)

Equipment:

• Electron beam evaporator BESTEC (EVAPORATOR)
• NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)
• Scanning Probe Microscope Bruker Dimension Icon (ICON-SPM)
• X-ray Photoelectron Spectroscopy Axis Supra (KRATOS-XPS)

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Alois Nebojsa
• Prof. Dinara Sobola, Ph.D.
• Rashid Dallaev, Ph.D.