Atomic force microscope JPK Nanowizzard (NANOWIZARD)

Photogallery

Specification

JPK NanoWizard AFM module is located on top of active anti-vibration stage to filter undesirable vibrations. The atomic force microscope could be coupled with Olympus LEXT OLS4100 confocal laser scanning microscope with an x-y motorized stage. A mutual sample holder transferable between the microscopes allows to observe and select the spot of interest by CLSM prior AFM scanning.

Features

Contact mode AFM

• High resolution topography imaging
  
• Force spectroscopy and force mapping AFM (local stiffness and stiffness maps of sample surface)
• Ideal for stiff samples
  

AC (“tapping”) mode AFM

• Topography scanning
  
• Ideal for both stiff and soft samples
  

Phase contrast mode

• Cantilever oscillation phase shift near surface
  
• Local surface properties-based contrast
  

Biomat Workstation with a liquidproof desgin

Co-localization by confocal laser scanning microscope Olympus Lext OLS4100

Scanning Electron Microscope (SEM)

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