A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering

AVVAL, T.; PRŮŠA, S.; ČECHAL, J.; CUSHMAN, C. V.; HODGES, G. T.; FEARN, S.; KIM, S. H.;ČECHAL, J.; VANÍČKOVÁ, E.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H. H.; LINFORD, M. R., 2023: . APPLIED SURFACE SCIENCE 607, p. 154551 - 9, doi: 10.1016/j.apsusc.2022.154551; FULL TEXT
(UHV-LEIS, UHV-XPS)

Equipment:

• UHV Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100 (UHV-LEIS)
• UHV Preparation and Analytical system - Photoelectron Spectroscopy SPECS Phoibos 150 (UHV-XPS)

Research Groups:

• Fabrication and Characterisation of Nanostructures
• Molecular Nanostructures at Surfaces
• CF: CEITEC Nano

CEITEC authors:

• Stanislav Průša, Ph.D.
• Prof. Jan Čechal, Ph.D.
• Elena Vaníčková
• Prof. Tomáš Šikola
• Pavel Bábík