X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(001) wafers

JOURNAL OF CRYSTAL GROWTH

Meduna, M; Kreiliger, T; Mauceri, M; Puglisi, M; Mancarella, F; La Via, F; Crippa, D; Miglio, L; von Kanel, H, 2019: X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(001) wafers. JOURNAL OF CRYSTAL GROWTH 507, p. 70 - 76, doi: 10.1016/j.jcrysgro.2018.10.046

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