The current and capacitance characteristics as a function of sample temperature in YMn0.90Os0.10O3/p-Si structures

Materials Science in Semiconductor Processing

Coskun, M.; Polat, O.; Coskun, F.M.; Efeoglu, H.; Caglar, M.; Durmus, Z.; Turut, A., 2019: The current and capacitance characteristics as a function of sample temperature in YMn0.90Os0.10O3/p-Si structures. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 102, p. 104587-1 - 104587-7, doi: 10.1016/j.mssp.2019.104587

Research Groups:

• CF: CEITEC Nano
• Fabrication and Characterisation of Nanostructures - Tomáš Šikola

CEITEC authors:

• Özgür Polat, Ph.D.