NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)


NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE

Guarantor:
Alois Nebojsa

Instrument status:
Operational Operational, 2.11.2022 15:51

Equipment placement:
CEITEC Nano - C1.21


The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities, absolute transmissivity and light scattering can be also measured.


Publications:

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Photogallery

Specification

Features

Spectral range 193 – 2000 nm
Retarder yes
Rotating analyser
Sample holder vertical
Angle of incidence 35° – 90°
Monochromator HS 190 (Woollam)

Advanced

Focusing probes Decreases the light beam to 200 microns in diameter

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