NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)
Guarantor:
Alois Nebojsa
Instrument status:
Operational, 2.11.2022 15:51
Equipment placement:
CEITEC Nano - C1.21
The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities, absolute transmissivity and light scattering can be also measured.
Publications:
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Hong, N. H.; Friák, M.; Pazourek, P.; Pham, N. S.; Nhu, T. Q.; Kiaba, M.; Gazdová, K.; Pavlů, J., 2024: 2D nature of magnetic states at SnO2 surfaces: a combined experimental and theoretical study. RSC ADVANCES 14(19), p. 13583 - 13590, doi: 10.1039/D4RA00734D; FULL TEXT
(RIGAKU3, VERSALAB, WOOLLAM-VIS, KRATOS-XPS) -
MATTERN, M.; PUDELL, J.; ARREGI URIBEETXEBARRIA, J.; ZLÁMAL, J.; KALOUSEK, R.; UHLÍŘ, V.; RÖSSLE, M.; BARGHEER, M., 2024: Accelerating the Laser-Induced Phase Transition in Nanostructured FeRh via Plasmonic Absorption. ADVANCED FUNCTIONAL MATERIALS 34(32), doi: 10.1002/adfm.202313014; FULL TEXT
(MAGNETRON, VERSALAB, RIGAKU9, ICON-SPM, WOOLLAM-VIS) -
KEPIČ, P.; LIŠKA, P.; IDESOVÁ, B.; CAHA, O.; LIGMAJER, F.; ŠIKOLA, T., 2024: Pulsed laser deposition of Sb2S3 films for phase-change tunable nanophotonics. NEW JOURNAL OF PHYSICS 26(1), p. 1 - 8, doi: 10.1088/1367-2630/ad1696; FULL TEXT
(ICON-SPM, KRATOS-XPS, LYRA, ALD, WITEC-RAMAN, RIGAKU9, WOOLLAM-VIS) -
Castellano, A.; Alhada-Lahbabi, K.; Arregi, JA.; Uhlir, V.; Perrin, B.; Gourdon, C.; Fournier, D.; Verstraete, MJ.; Thevenard, L., 2024: Magnetic phase dependency of the thermal conductivity of FeRh from thermoreflectance experiments and numerical simulations. PHYSICAL REVIEW MATERIALS 8(8), doi: 10.1103/PhysRevMaterials.8.084411; FULL TEXT
(MAGNETRON, VERSALAB, RIGAKU9, WOOLLAM-VIS) -
Franta, D.; Vohánka, J.; Dvořák, J.; Franta, P.; Ohlídal, I.; Klapetek, P.; Březina, J.; Škoda, D., 2023: Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model. COATINGS 13(2), doi: 10.3390/coatings13020218; FULL TEXT
(WOOLLAM-VIS, FTIR)
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BIJALWAN, V.; KAŠTYL, J.; PRAJZLER, V.; ERHART, J.; POUCHLÝ, V.; MACA, K., 2023: (Ba,Ca)(Ti,Zr)O3-CeO2 translucent and opaque ceramics - Optical and electromechanical characteristics. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 43(2), p. 341 - 9, doi: 10.1016/j.jeurceramsoc.2022.10.022; FULL TEXT
(VERIOS, WOOLLAM-VIS) -
Rotta Loria, S.; Bricchi, B. R.; Schirato, A.; Mascaretti, L.; Mancarella, C.; Naldoni, A.; Li Bassi, A.; Della Valle, G.; Zavelani‐Rossi, M., 2023: Unfolding the Origin of the Ultrafast Optical Response of Titanium Nitride. ADVANCED OPTICAL MATERIALS 11(15), doi: 10.1002/adom.202300333; FULL TEXT
(WOOLLAM-VIS) -
Duchaň; M., 2023: Study of optical response of ferromagnetic manganese oxides. BACHELOR´S THESIS , p. 1 - 31; FULL TEXT
(WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9) -
Hale, N.; Hartl, M.; Humlicek, J.; Brüne, C.; Kildemo, M., 2023: Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry. OPTICAL MATERIALS EXPRESS 13(7), p. 2020 - 16, doi: 10.1364/OME.493426; FULL TEXT
(WOOLLAM-MIR, WOOLLAM-VIS) -
Zahradník, M.; Kiaba, M.; Espinoza, S.; Rebarz, M.; Andreasson, J.; Caha, O.; Abadizaman, F.; Munzar, D.; Dubroka, A., 2022: Photoinduced insulator-to-metal transition and coherent acoustic phonon propagation in LaCoO3 thin films explored by femtosecond pump-probe ellipsometry. PHYSICAL REVIEW B 105(23), doi: 10.1103/PhysRevB.105.235113; FULL TEXT
(WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9) -
Červeň, M., 2022: Optical response of interband transitions in LaFeO3. BACHELOR´S THESIS
(WOOLLAM-VIS) -
MASCARETI, L.; BARMAN, T.; BRICCHI, BC.; MÜNZ, F.; LI BASSI, A.; KMENT, Š.; NALDONI, A., 2021: Controlling the plasmonic properties of titanium nitride thin films by radiofrequency substrate biasing in magnetron sputtering. APPLIED SURFACE SCIENCE 554, p. 149543-1 - 9, doi: 10.1016/j.apsusc.2021.149543; FULL TEXT
(WOOLLAM-VIS) -
KODAMA, J.; HARUMNINGTYAS, A.; ITO, T.; MICHLÍČEK, M.; SUGIMOTO, S.; KITA, H.; CHIJIMATSU, R.; UKON, Y.; KUSHIOKA, J.; OKADA, R.; KAMATANI, T.; HASHIMOTO, K.; TATEIWA, D.; TSUKAZAKI, H.; NAKAGAWA, S.; TAKENAKA, S.; MAKINO, T.; SAKAI, Y.; NEČAS, D.; ZAJÍČKOVÁ, L.; HAMAGUCHI, S.; KAITO, T., 2021: Amine modification of calcium phosphate by low-pressure plasma for bone regeneration. SCIENTIFIC REPORTS 11(1), p. 1 - 15, doi: 10.1038/s41598-021-97460-8; FULL TEXT
(WOOLLAM-VIS) -
MICHLÍČEK, M.; BLAHOVÁ, L.; DVOŘÁKOVÁ, E.; NEČAS, D.; ZAJÍČKOVÁ, L., 2021: Deposition penetration depth and sticking probability in plasma polymerization of cyclopropylamine. APPLIED SURFACE SCIENCE 540, p. 1 - 10, doi: 10.1016/j.apsusc.2020.147979; FULL TEXT
(WOOLLAM-VIS, FTIR, KRATOS-XPS, LYRA) -
KEPIČ, P.; LIGMAJER, F.; HRTOŇ, M.; REN, H.; MENEZES, L.; MAIER, S.; ŠIKOLA, T., 2021: Optically Tunable Mie Resonance VO2 Nanoantennas for Metasurfaces in the Visible. ACS PHOTONICS 8(4), p. 1048 - 10, doi: 10.1021/acsphotonics.1c00222; FULL TEXT
(EVAPORATOR, MIRA-EBL, WITEC-RAMAN, WOOLLAM-VIS) -
ZAZPE MENDIOROZ, R.; SOPHA, H.; CHARVOT, J.; KRUMPOLEC, R.; RODRIGUEZ PEREIRA, J.; MICHALIČKA, J.; MISTRÍK, J.; BAČA, D.; MOTOLA, M.; BUREŠ, F.; MACÁK, J., 2021: 2D MoTe2 nanosheets by atomic layer deposition: Excellent photo-electrocatalytic properties. APPLIED MATERIALS TODAY 23, p. 1 - 11, doi: 10.1016/j.apmt.2021.101017; FULL TEXT
(TITAN, WOOLLAM-VIS) -
Papez, N; Gajdos, A; Sobola, D; Dallaev, R; Macku, R; Skarvada, P; Grmela, L, 2020: Effect of gamma radiation on properties and performance of GaAs based solar cells. APPLIED SURFACE SCIENCE 527, p. 146766-1 - 146766-11, doi: 10.1016/j.apsusc.2020.146766
(WOOLLAM-VIS, SIMS, FTIR, WITEC-RAMAN, LYRA) -
Číž, T., 2020: X-ray diffraction analysis of oxide layers. MASTER´S THESIS
(KRATOS-XPS, WOOLLAM-VIS, RIGAKU9, SIMS) -
GABLECH, I.; SVATOŠ, V.; CAHA, O.; DUBROKA, A.; PEKÁREK, J.; KLEMPA, J.; NEUŽIL, P.; SCHNEIDER, M.; ŠIKOLA, T., 2019: Preparation of high-quality stress-free (001) aluminum nitride thin film using a dual kaufman ion-beam source setup. THIN SOLID FILMS 670, p. 105 - 8, doi: 10.1016/j.tsf.2018.12.035; FULL TEXT
(KAUFMAN, RIGAKU9, WOOLLAM-VIS, ICON-SPM) -
SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S., 2019: Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE-POLAND 37(2), p. 1 - 6, doi: 10.2478/msp-2019-0030; FULL TEXT
(WOOLLAM-VIS, VERIOS, TERS) -
Vida, J., 2019: Deposition of ternary oxides with titanium and characterization of their optical and electrical properties. MASTER´S THESIS , p. 1 - 50
(ALD, WOOLLAM-VIS, VUVAS, EVAPORATOR, SUSS-MA8, SUMMIT, KRATOS-XPS, RIGAKU3) -
Pokorný, D., 2019: Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element. MASTER´S THESIS , p. 1 - 71
(WOOLLAM-VIS, ALD, KRATOS-XPS) -
KAUSHIK, P.; ELIÁŠ, M.; MICHALIČKA, J.; HEGEMANN, D.; PYTLÍČEK, Z.; NEČAS, D.; ZAJÍČKOVÁ, L., 2019: Atomic layer deposition of titanium dioxide on multi-walled carbon nanotubes for ammonia gas sensing. SURFACE AND COATINGS TECHNOLOGY 370, p. 235 - 9, doi: 10.1016/j.surfcoat.2019.04.031; FULL TEXT
(ALD, EVAPORATOR, PECVD-NANOFAB, WOOLLAM-VIS, VERIOS, TITAN, KRATOS-XPS, RIGAKU3) -
KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L., 2019: Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. APPLIED SURFACE SCIENCE 493, p. 673 - 6, doi: 10.1016/j.apsusc.2019.07.058; FULL TEXT
(EVAPORATOR, WOOLLAM-VIS, KRATOS-XPS, ICON-SPM) -
Ligmajer, F., 2018: Advanced plasmonic materials for metasurfaces and photochemistry. PH.D. THESIS , p. 1 - 142
(VERIOS, RIGAKU9, SNOM-NANONICS, FTIR, WOOLLAM-VIS, TITAN, ICON-SPM) -
Dvořák, P., 2018: Nanophotonics. PH.D. THESIS , p. 1 - 134
(SNOM-NANONICS, TERS, EVAPORATOR, FTIR, WOOLLAM-VIS, LYRA) -
TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O., 2018: How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 85, p. 15 - 9, doi: 10.1016/j.mssp.2018.05.030; FULL TEXT
(VERIOS, TERS, WOOLLAM-VIS) -
Friš, P.; Munzar, D.; Caha, O.; Dubroka, A., 2018: Direct observation of double exchange in ferromagnetic La0.7Sr0.3CoO3 by broadband ellipsometry. PHYSICAL REVIEW B 97(4), p. 045137-1 - 045137-5, doi: 10.1103/PhysRevB.97.045137
(WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9, FTIR, CRYOGENIC) -
KLENOVSKÝ, P.; ZŮDA, J.; KLAPETEK, P.; HUMLÍČEK, J., 2017: Ellipsometry of surface layers on a 1-kg sphere from natural silicon. APPLIED SURFACE SCIENCE 421, p. 542 - 5, doi: 10.1016/j.apsusc.2016.08.135; FULL TEXT
(WOOLLAM-VIS) -
Dubroka, A; Caha, O; Hroncek, M; Fris, P; Orlita, M; Holy, V; Steiner, H; Bauer, G; Springholz, G; Humlicek, J, 2017: Interband absorption edge in the topological insulators Bi-2(Te1-xSex)(3). PHYSICAL REVIEW B 96(23), doi: 10.1103/PhysRevB.96.235202
(FTIR, RIGAKU9, WOOLLAM-MIR, WOOLLAM-VIS) -
Kukolova, A., 2017: Experimental study of electronic properties of manganites and electron stimulated desorption. MASTER´S THESIS , p. 1 - 91
(WOOLLAM-MIR, WOOLLAM-VIS, CRYOGENIC) -
Fris, P.; Dubroka, A., 2017: Vacuum variable-angle far-infrared ellipsometer. APPLIED SURFACE SCIENCE 421, p. 430 - 434, doi: 10.1016/j.apsusc.2016.10.125
(FTIR, WOOLLAM-VIS)
Photogallery
Specification
Features
Spectral range | 193 – 2000 nm |
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Retarder | yes |
Rotating analyser |
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Sample holder | vertical |
Angle of incidence | 35° – 90° |
Monochromator | HS 190 (Woollam) |
Advanced
Focusing probes |
Decreases the light beam to 200 microns in diameter
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Documents
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