Microstructural characterization of medium entropy alloy thin films

Scripta Materialia

Chawake, N.; Zálešák, J.; Gammer, Ch.; Franz, R.; Cordill, M. J.; Kim, J. T.; Eckert, J., 2020: Microstructural characterization of medium entropy alloy thin films. SCRIPTA MATERIALIA 177, p. 22 - 26, doi: 10.1016/j.scriptamat.2019.10.001
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