Ion polisher Fischione TEM Mill 1050 (FISCHIONE-TEM-MILL)


Ion polisher Fischione TEM Mill 1050

Guarantor:
Jiří Holas

Instrument status:
Operational Operational, 15.11.2023 10:34

Equipment placement:
CEITEC Nano - A1.08


Machine for creating thin electron transparent specimens for TEM. TEM Mill incorporates two independently adjustable ion sources, liquid nitrogen specimen cooling, automatic gas control, and a vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. Tilt angles are adjustable in the range from –10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is available. The TEM Mill includes a microscope with a CCD camera for better specimen viewing and polishing process control.


Publications:

Photogallery

Specification

Ion sourceTwo ion guns, single controllable
Ion source energyfrom 100 eV to 6 keV
Beam current densityup to 10 mA/cm2
Process gasArgon, 99,999 % purity


Specimen stage

Milling angle range–10° to +10°
Specimen rotationavailable with motion sequencing
Specimen rockingavailable


Documents

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