Ion polisher Fischione TEM Mill 1050 (FISCHIONE-TEM MILL)
Operational, 16.5.2018 16:06
CEITEC Nano - A1.08
Machine for creating thin electron transparent specimens for TEM. TEM Mill incorporates two independently adjustable ion sources, liquid nitrogen specimen cooling, automatic gas control, and a vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. Tilt angles are adjustable in the range from –10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is available. The TEM Mill includes a microscope with CCD camera for better specimen viewing and polishing process control.
Zboncak, M.; Ondreas, F.; Uhlir, V.; Lepcio, P.; Michalicka, J.; Jancar, J., 2019: Translation of segment scale stiffening into macroscale reinforcement in polymer nanocomposites. POLYMER ENGINEERING & SCIENCE
(MIRA3-XMU, FISCHIONE-TEM MILL)
|Ion source||Two ion guns, single controllable|
|Ion source energy||
from 100 eV to 6 keV
|Beam current density||up to 10 mA/cm2|
|Process gas||Argon, 99,999 % purity|
|Milling angle range||–10° to +10°|
|Specimen rotation||available with motion sequencing|
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