Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy

INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER

KLAPETEK, P.; MARTINEK, J.; GROLICH, P.; VALTR, M.; KAUR, N., 2017: Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER 108, p. 841 - 10, doi: 10.1016/j.ijheatmasstransfer.2016.12.036; FULL TEXT

Research Groups:

• Development of Methods for Analysis and Measuring
• CF: CEITEC Nano

CEITEC authors:

• Petr Klapetek, Ph.D.
• Miroslav Valtr, Ph.D.
• M.Sc. Nupinder Jeet Kaur