Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors

Ultramicroscopy

Stöger-Pollach, M.; Bukvišová, K.; Schwarz, S.; Kvapil, M.; Šamořil, T.; Horák, M., 2019: Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors. ULTRAMICROSCOPY 200, p. 111 - 124, doi: 10.1016/j.ultramic.2019.03.001
(HELIOS, LYRA)

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