Effect of the Pressure Exerted by Probe Station Tips in the Electrical Characteristics of Memristors

Advanced Electronic Materials

Zuo, Y.; Lin, H.; Guo, J.; Yuan, Y.; He, H.; Li, Y.; Xiao, Y.; Li, X.; Zhu, K.; Wang, T.; Jing, X.; Wen, Ch.; Lanza, M., 2020: Effect of the Pressure Exerted by Probe Station Tips in the Electrical Characteristics of Memristors. ADVANCED ELECTRONIC MATERIALS 6(3), p. 1901226-1 - 1901226-8, doi: 10.1002/aelm.201901226

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