X-ray rocking curve imaging on large arrays of extremely tall SiGe microcrystals epitaxial on Si

Journal of Applied Crystallography

Meduňa, M.; Caha, O.; Choumas, E.; Bressan, F.; von Känel, H., 2021: X-ray rocking curve imaging on large arrays of extremely tall SiGe microcrystals epitaxial on Si. JOURNAL OF APPLIED CRYSTALLOGRAPHY 54(4), p. 1071 - 1080, doi: 10.1107/S1600576721004969; FULL TEXT
(RIGAKU9)

Equipment:

• X-ray diffractometer with high brightness source Rigaku SmartLab 9kW (RIGAKU9)

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Ondřej Caha, Ph.D.