In-depth Analysis of 10 nm Exynos Processor using Micro CT and FIB-SEM System

IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

SHARANG, S.; DLUHOŠ, J.; KALASOVÁ, D.; DENISYUK, A.; VÁŇA, R.; ZIKMUND, T.; KAISER, J.; OBONA, J., 2019: In-depth Analysis of 10 nm Exynos Processor using Micro CT and FIB-SEM System. IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS ; FULL TEXT
(micro-CT-L240)

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