Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%

SURFACE AND INTERFACE ANALYSIS

KORMOŠ, L.; KRATZER, M.; KOSTECKI, K.; OEME, M.; ŠIKOLA, T.; KASPER, E.; SCHULZE, J.; TEICHERT, C., 2017: Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%. SURFACE AND INTERFACE ANALYSIS 49(4), p. 297 - 6, doi: 10.1002/sia.6134; FULL TEXT
(LYRA)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)

Research Groups:

• Fabrication and Characterisation of Nanostructures
• CF: CEITEC Nano

CEITEC authors:

• Prof. Tomáš Šikola