Growth defects in WC:H layers for tribological applications

VACUUM

Mates, T; Polasek, J; Mares, P; Dubau, M; Vetusko, A; Ledinsky, M; Fejfar, A; Vyskocil, J, 2020: Growth defects in WC:H layers for tribological applications. VACUUM 178, p. 109372-1 - 7, doi: 10.1016/j.vacuum.2020.109372; FULL TEXT

Research Groups:

• LNSM
• CF: CEITEC Nano