Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis

SCIENTIFIC REPORTS

JAQUES, V.; ZIKMUNDOVÁ, E.; HOLAS, J.; ZIKMUND, T.; KAISER, J.; HOLCOVÁ, K., 2022: Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis. SCIENTIFIC REPORTS 12(1), doi: 10.1038/s41598-022-21882-1; FULL TEXT
(MIRA-STAN, CITOPRESS, LEICACOAT-STAN, TEGRAMIN)

Equipment:

• Scanning electron microscope (SEM) MIRA3 XMU (MIRA-STAN)
• Mounting press Citopress 10 (CITOPRESS)
• Coater Leica EM ACE600 (LEICACOAT-STAN)
• Grinder/polisher Tegramin 30 (TEGRAMIN)

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization
• CF: CEITEC Nano

CEITEC authors:

• Victory Jaques
• Tomáš Zikmund, Ph.D.
• Jiří Holas
• Prof. Jozef Kaiser, Ph.D.
• Eva Zikmundová, Ph.D.