AXIS Supra is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterization. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode.
X-ray photoelectron spectroscopy (XPS) provides information on elemental composition and chemical bonding states of materials, Ultraviolet photoelectron spectroscopy (UPS) provides information on valence levels and work function of materials, Low energy Ion Scattering spectrometry (ISS) provides evaluation of the elemental composition and structure of solid surfaces. XPS mode is also capable of surface mapping to provide lateral distribution maps of elemental and chemical species at the surface.
The system is also equipped by Argon cluster ion source for sample cleaning or depth profiling.
Surface science station chamber connected to the sample analysis chamber can be configured with a number of surface science techniques. Current configuration offers sample preparation in high temperature gas reaction cell or deposition by effusion cell. After the preparation, samples are transferred to the main chamber for analysis (in-situ).