Semi-automated 4-probe system Cascade Microtech SUMMIT 12000

Robert Dóczy

SUMMIT Semi-automated probe station is precise on-wafer device and process characterization system. This test instruments allows measuring of semiconductor structures on wafers up to 200mm diameter. System is designed for RF/Microwave application, device characterization, wafer level reliability and special e-tests. Probe system has EMI shielding for low noise measurement, DC, RF mmW, FA, WLR and more configurations of measuring.

               ​​​                ​