Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity

ACS APPL MATER INTER

KONEČNÝ, M.; BARTOŠÍK, M.; MACH, J.; ŠVARC, V.; NEZVAL, D.; PIASTEK, J.; PROCHÁZKA, P.; CAHLÍK, A.; ŠIKOLA, T., 2018: Kelvin Probe Force Microscopy and Calculation of Charge Transport in a Graphene/Silicon Dioxide System at Different Relative Humidity. ACS APPL MATER INTER 10(14), p. 11987 - 8, doi: 10.1021/acsami.7b18041; FULL TEXT
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