X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(0 0 1) wafers

Journal of Crystal Growth

Meduňa, M.; Kreiliger, T.; Mauceri, M.; Puglisi, M.; Mancarella, F.; La Via, F.; Crippa, D.; Miglio, L.; von Känel, H., 2019: X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(0 0 1) wafers. JOURNAL OF CRYSTAL GROWTH 507, p. 70 - 76, doi: 10.1016/j.jcrysgro.2018.10.046

Research Groups:

• CF: CEITEC Nano

CEITEC authors:

• Mojmír Meduňa, Ph.D.