Hysitron TI 950 (NANOINDENTER)


Guarantor:
M.Sc. Saeed Mirzaei, Ph.D.

Instrument status:
Operational Operational, 21.4.2021 09:19

Equipment placement:
CEITEC Nano - C1.22


The proposed set of technologies represents a complex, versatile and effective nano- and micromechanical characterization tool for a wide range of possible applications of bulk materials and thin films (polymeric, metallics, composite components of MEMS/NEMS etc.)


Publications:

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Specification


Hysitron's TI 950 TriboIndenter Features:

Quasistatic nanoindentation – Measure Young’s modulus, hardness, fracture toughness, and other mechanical properties via nanoindentation.
Scratch testing – Quantify scratch resistance, critical delamination forces, and friction coefficients with simultaneous normal and lateral force and displacement monitoring.
Top-down optics – High- resolution, colour CCD camera for individual structure identification and coarse test positioning.
SPM imaging – In-situ imaging using the indenter tip provides nanometer precision test positioning and surface topography information
Dual head testing capability for true nano/micro-scale connectivity
Active vibration isolation system providing environmental separation

Available modules:

nanoDMA – Investigate time-dependent properties of materials using a dynamic testing technique designed specifically for polymers and biomaterials
Modulus Mapping – Obtain quantitative maps of the storage and loss stiffness and moduli from a single SPM scan 3D OmniProbe – Provides forces up to 10 N and scratch lengths up to 150 mm for depth- sensing micro-indentation and tribological studies
nanoECR – Conductive nanoindentation system capable of providing simultaneous in-situ electrical and mechanical measurements for investigating material deformation and stress-induced transformation behaviour
Thermal control – Heating/cooling stages can be added for the investigation of mechanical properties at non-ambient temperatures
Vacuum stage – Wafer mounting system that eliminates the necessity of glueing or cutting wafers prior to testing
Long probes that allow to safely investigate the mechanical properties of samples immersed in water.

Reference:

http://www.hysitron.com/products/ti-series/ti-950-triboindenter


Documents


Measurement Planning

Prior measurement – Quasi-Static NanoIndentation

Minimum requirements to use NanoIndenter recommended for new users at CEITEC Nano RI

Documents