MIR spectroscopic ellipsometer J. A. Woollam IR-VASE

Alois Nebojsa

The spectroscopic ellipsometer covers the spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). The IR-VASE offers non-contact measurements of many different material properties including thickness, optical constants, material composition, chemical bonding, doping concentration and more. Measurements do not require vacuum and can be used to study liquid/solid interfaces common in biological and chemical applications.

Features

Spectral range1.7 to 30 microns (333 to 5900 wavenumbers)
Sample holdervertical
InterferometerFTLA 2000