LiteScope (LITESCOPE)


LiteScope

Instrument status:
Operational Operational, 23.6.2020 09:17

Equipment placement:
Vysoké učení technické v Brně, CEITEC

Upcoming trainings:
6.10. 08:30 - 14:30: Mira3 XMU for users with SEM experience other than Mira/Lyra - Suitable only for users with previous SEM experience other than Mira/Lyra. Users with active Lyra certificate can ask for a shortened training instead. Meeting point at the microscope. Optionally bring your own samples.


A unique atomic force microscope, the LiteScopeTM, designed for easy integration into a scanning electron microscope, represents a next-generation tool for complex in-situ characterization of samples in the field of material science, semiconductors, or life-science. It is equipped with patented CPEMTM technology allowing simultaneous acquisition and in-time correlation of both SEM and AFM signals providing outstanding imaging results.


Publications:

Photogallery

Specification

Here is place to edit your specification.

Documents