Ion polisher Fischione TEM Mill 1050
Machine for creating thin electron transparent specimens for TEM. TEM Mill incorporates two independently adjustable ion sources, liquid nitrogen specimen cooling, automatic gas control, and a vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. Tilt angles are adjustable in the range from –10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is available. The TEM Mill includes a microscope with CCD camera for better specimen viewing and polishing process control.
|Ion source||Two ion guns, single controllable|
|Ion source energy||from 100 eV to 6 keV|
|Beam current density||up to 10 mA/cm2|
|Process gas||Argon, 99,999 % purity|
|Milling angle range||–10° to +10°|
|Specimen rotation||available with motion sequencing|