Atomic force microscope JPK Nanowizzard (JPK-NANOWIZARD)


Atomic force microscope JPK Nanowizzard

Guarantor:
Petr Lepcio, Ph.D.

Instrument status:
Operational Operational, 6.3.2020 14:49, Moved to Optical Laboratory (Nanocharacterization)

Equipment placement:
CEITEC Nano - C1.21


AFM module allows for nanoscale surface microscopy with atomic resolution of a sample observed with CLSM. It is based on attractive and repulsive forces between surface of the sample (atoms at the surface) and a probe with a fine tip mounted on a flexible cantilever which scans across the surface. The forces are converted into bending or deflection of the cantilever which is detected by laser beam reflected from the back side of the cantilever into detector. Both conductive and insulating, solid and liquid samples can be visualized by AFM into a real 3D detail of surface. AFM module shifts performance of CLSM above the resolution capability of SEM (AFM resolution is < 1 nm in case of ideal samples and very fine tips) without the need of surface metal coating which covers up details at scale from one to tens of nanometers.

Photogallery

Specification

JPK NanoWizard AFM module is located on top of active anti-vibration stage to filter undesirable vibrations. The atomic force microscope could be coupled with Olympus LEXT OLS4100 confocal laser scanning microscope with an x-y motorized stage. A mutual sample holder transferable between the microscopes allows to observe and select the spot of interest by CLSM prior AFM scanning.

Features

Contact mode AFM

  • High resolution topography imaging
  • Force spectroscopy and force mapping AFM (local stiffness and stiffness maps of sample surface)
  • Ideal for stiff samples

AC (“tapping”) mode AFM

  • Topography scanning
  • Ideal for both stiff and soft samples

Phase contrast mode

  • Cantilever oscillation phase shift near surface
  • Local surface properties-based contrast

Biomat Workstation with a liquidproof desgin

Co-localization by confocal laser scanning microscope Olympus Lext OLS4100

Scanning Electron Microscope (SEM)

JPK NanoWizzard

Piezo z-range
15 µm
Maximum scanning area(100 × 100) µm
Manual travel range XY10 mm
Resolution (ideal conditions)< 1 nm
Co-localization repeatability< 5 μm

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